BT137B800G Triac
From Philips Semiconductors / NXP Semiconductors
| @ t(w) (s) (Test Condition) | 20m |
| @I(T) (A) (Test Condition) | 12 |
| @Temp. (°C) (Test Condition) | 125 |
| I(D) Max. (A) Leakage Current | 500u |
| I(GT) Max. (A) | 50m |
| I(H) Max.(A) Holding Current | 40m |
| I(T(RMS)) Max.(A)On-State Cur. | 8.0 |
| I(TSM) Max. (A) | 55 |
| Package | SOT-404 |
| V(DRM) Max.(V)Rep.Pk.Off Volt. | 800 |
| V(GT) Max.(V) | 1.5 |
| V(T) Max. (V) | 1.7 |
| dv/dt Min. (V/us) | 200 |
| t(gt) Typ. (s) | 2.0u |
